diffraction instrument

diffraction instrument的基本解释

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衍射计, 衍射仪

与diffraction instrument相关的网络例句 [注：此内容来源于网络，仅供参考]

X-ray diffraction is one of the most common and efficient ways to measure a superlattice structure. This dissertation displays the detail results for characterization of Ge〓Si〓/Si superlattices by x-ray diffraction (including x-ray small angle diffraction and double crystal diffraction). It was found, when the growth temperature is lower, the intensities of xray small angle diffraction peaks are modulated by a periodical function, which indicates that both sets of interfaces of the superlattice is highly flat; when the growth temperature is higher, the diffraction peak intensities are simply decay with the increase of diffraction vector, which indicates that one set of interfaces is highly flat but another is not; when the growth temperature is very high, the diffraction peaks are reduced more rapidly, which indicates that both sets of interfaces are not ideal.

本文详细介绍了用X-射线衍射（包括X-射线小角衍射和双晶衍射）方法对Ge〓Si〓/Si超晶格结构特性测试的结果，尤其是发现，当Ge〓Si〓/Si超晶格的生长温度较低时，X-射线小角衍射谱峰的强度随着衍射波矢的增加而周期性调制，表明超晶格的两套界面都十分平整；当生长温度较高时，Ge〓Si〓Si超晶格的X-射线小角衍射谱峰的强度随着衍射波矢呈简单的衰减变化，对应于超晶格内有一套界面不平整的情况；当生长温度进一步提高时，X-射线小角衍射峰明显减少，表明超晶格内两套界面都不理想。

The camera length of electron diffraction in transmisson electron microscopy is one of the main technical parameters in designing electron microscope and the electron diffraction analysis to microcrystal sample. According to Bragg law, the formula of calculating TEM electron diffraction camera length is derived from the research on the ray path of electron diffraction images in TEM and the comparison on electron diffraction with ordinary electronic diffractometer. The difference of physical significance of electron diffraction camera length between TEM and ordinary electronic diffractometer is discussed.

透射式电子显微镜(Transmisson Electron Microcopy， TEM)中的电子衍射相机长度，是电子显微镜设计和对微晶体样品进行电子衍射分析的主要技术参数之一依据布拉格定律，经对TEM中电子衍射成像光路的探讨与研究，并通过TEM与普通电子衍射仪的电子衍射的对比分析，导出了TEM电子衍射相机长度的精确计算公式，阐述了TEM和普通电子衍射仪的电子衍射相机长度所表征的物理意义的区别。

Management content: The company product mainly covers the microscope, the tool maker's microscope, the projecting apparatus, the sclerometer, the thickness gauge, the magnifying glass, the balance, the measuring instrument quantity meter, the mapping equipment, the metering equipment, to test the instrument, the electrochemistry instrument, the physical instrument, the analytic instrument, the biochemistry instrument, the non-destructive inspection, the medical instrument, the processing machinery and so on altogether 28 broad headings, 170 minor sort large-scale specialized precision instrument measuring appliance sale enterprises.

经营内容：公司产品主要涵盖显微镜、工具显微镜、投影仪、硬度计、测厚仪、放大镜、天平、量具量仪、测绘仪器、测量仪器、实验仪器、电化学仪器、物理仪器、分析仪器、生化仪器、无损检测、医疗器械、加工机械等共28大类，170余个小类的大型专业精密仪器仪表价格企业。

与diffraction instrument相关的网络解释 [注：此内容来源于网络，仅供参考]

Airy diffraction integral：爱里衍射积分

Airy diffraction disc 爱里衍射斑 | Airy diffraction integral 爱里衍射积分 | Airy diffraction pattern 爱里衍射图样

diffraction breakup：衍射中断

diffraction angle 衍射角 | diffraction breakup 衍射中断 | diffraction broadening 衍射增宽

diffraction breakup：绕射崩裂

绕射 diffraction | 绕射崩裂 diffraction breakup | 绕射宽化 diffraction broadening