查询词典 math test

Sign Test -- The sign test is the nonparametric "version" of the 1-sample t-test.

符号检验--符号检验是等同于一个样本t-检验的非参数检验。

Was evaluated by BPRS Statistical with SPSS 13.0 software was used for data processing with t test, nonparametric test and χ^2 test for efficacy analysis.

数据处理使用SPSS13.0统计软件，应用t检验、非参数检验、χ^2检验等检验方法。

Make a test program according to test plan; ensure the test program can be implemented operatively

根据试验计划编制试验方案，确保试验方案的可操作性

Based on this, a new WENO difference scheme which based on Dispersion-Relation-Preserving relation is developed, and representative test cases with this scheme for computational aeroacoustics problems has been implemented and compared in order to test capability of wave capturing; In addition, WENO schemes generally do not converge at high order in the presence of contact discontinuity of Euler equations, so a conservative front tracking technique coupling WENO schemes and Level Set method to simulate the translating density profile is presented here, and numerical simulation with this technique for representative test case has been implemented and results show the desired accuracy.

本文研究了高阶精度加权基本无振荡格式及其在双曲守恒律方程中的应用，在此基础上作了两个方面的工作：一是针对高频声波问题构造出一种基于保色散关系的WENO有限差分格式，并对计算气动声学问题的代表性算例进行了大量数值实验，比较了该格式捕捉波数的能力；另外，针对高阶WENO格式在处理Euler方程的接触间断时精度有所降低的问题，研究了利用界面追踪技术Level Set方法和高阶激波捕捉WENO格式相结合的一种守恒追踪方法，并且给出有代表性的密度滑移面问题的算例，得到一致高阶精度的数值模拟结果。

9 Lead to turn on electricity a test: LCD manifestation:Overdischarge Test, the test semi-processed goods battery lead to turn on electricity protection function, if the battery electric voltage be low to the 9.2 V can't stop turn on electricity, LCD manifestation:Overdischarge Fail.

4.9 过放电测试： LCD显示：Overdischarge Test，测试半成品电池过放电保护功能，若电池电压低到9.2V时不能停止放电，LCD显示：Overdischarge Fail。

Again, you can use the test method, test or partial test page to print internal printer parts to see the cause of the malfunction.

再次，可以使用测试法，进行测试页打印或者局部测试打印机内部件，看故障原因。

To accord with normal test and anova test, the compare between two groups with T-test, the compare between before and after oneself with Paired comparison.

符合正态性检验和方差齐性检验，两组间比较用t检验，自身前后变化比较用配对t检验。

This paper studies the attribute of test sequence inherent in the parallel test,and proposes the parallelizability of test sequence.

通过测试序列实例，验证了可并行性是测试序列的固有属性，说明了可并行度概念的合理性。

Besides, parametric approaches basing on shorter estimation period meet the test well in independent coverage test but it does worse in unconditional coverage test.

此外在此独立性检定下参数法估计期间较短有较佳的结果与无条件覆盖比率检定相反。

Provide test and measurement solutions for device characterization and monitoring semiconductor wafer processing, including DC to RF Automated Parametric Test systems, Wafer Level Reliability systems, and I-V/C-V test systems.

我们的产品可用于半导体特性分析、参数测试、半导体晶片生产工艺监控，覆盖从DC到RF的自动参数测试系统，晶片可靠性系统和I-V/C-V测试系统。

What was it that made you want to change sider ?

是什么使你临阵倒戈？

I don't know what he wants, but let's play along with him.

我不知道他要干什么，可我