Bragg diffraction

Bragg diffraction的基本解释

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布拉格衍射

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布拉格散射

与Bragg diffraction相关的网络例句 [注：此内容来源于网络，仅供参考]

X-ray diffraction is one of the most common and efficient ways to measure a superlattice structure. This dissertation displays the detail results for characterization of Ge〓Si〓/Si superlattices by x-ray diffraction (including x-ray small angle diffraction and double crystal diffraction). It was found, when the growth temperature is lower, the intensities of xray small angle diffraction peaks are modulated by a periodical function, which indicates that both sets of interfaces of the superlattice is highly flat; when the growth temperature is higher, the diffraction peak intensities are simply decay with the increase of diffraction vector, which indicates that one set of interfaces is highly flat but another is not; when the growth temperature is very high, the diffraction peaks are reduced more rapidly, which indicates that both sets of interfaces are not ideal.

本文详细介绍了用X-射线衍射（包括X-射线小角衍射和双晶衍射）方法对Ge〓Si〓/Si超晶格结构特性测试的结果，尤其是发现，当Ge〓Si〓/Si超晶格的生长温度较低时，X-射线小角衍射谱峰的强度随着衍射波矢的增加而周期性调制，表明超晶格的两套界面都十分平整；当生长温度较高时，Ge〓Si〓Si超晶格的X-射线小角衍射谱峰的强度随着衍射波矢呈简单的衰减变化，对应于超晶格内有一套界面不平整的情况；当生长温度进一步提高时，X-射线小角衍射峰明显减少，表明超晶格内两套界面都不理想。

The camera length of electron diffraction in transmisson electron microscopy is one of the main technical parameters in designing electron microscope and the electron diffraction analysis to microcrystal sample. According to Bragg law, the formula of calculating TEM electron diffraction camera length is derived from the research on the ray path of electron diffraction images in TEM and the comparison on electron diffraction with ordinary electronic diffractometer. The difference of physical significance of electron diffraction camera length between TEM and ordinary electronic diffractometer is discussed.

透射式电子显微镜(Transmisson Electron Microcopy， TEM)中的电子衍射相机长度，是电子显微镜设计和对微晶体样品进行电子衍射分析的主要技术参数之一依据布拉格定律，经对TEM中电子衍射成像光路的探讨与研究，并通过TEM与普通电子衍射仪的电子衍射的对比分析，导出了TEM电子衍射相机长度的精确计算公式，阐述了TEM和普通电子衍射仪的电子衍射相机长度所表征的物理意义的区别。

The principle of the two dimensional acoustooptic Q switch is presented,the formulas of the diffraction efficiency and diffraction loss of the AO Q switch with normal Bragg diffraction is derived,the relationship between One dimensional and Two dimensional Bragg diffraction is analyzed.

描述了两维声光Q开关的基本原理，详细推导出正常布喇格衍射的两维声光Q开关衍射效率和衍射损耗的表达式，分析了两维布喇格衍射和一维布喇格衍射之间的关系，并给出了在驱动功率40W、光束直径5mm、光波长1。

与Bragg diffraction相关的网络解释 [注：此内容来源于网络，仅供参考]

Bragg diffraction：布喇格衍射,布喇格绕射

Bragg angle 布喇格角 | Bragg diffraction 布喇格衍射,布喇格绕射 | Bragg plane 布喇格平面

Bragg diffraction：布喇格衍射

Bragg deflector 布喇格偏转器 | Bragg diffraction 布喇格衍射 | Bragg effect 布喇格效应

Bragg diffraction：布拉格衍射

"布拉格条件","Bragg condition" | "布拉格衍射","Bragg diffraction" | "布拉格方程[式]","Bragg equation"

Bragg diffraction：布 格衍射,布 格绕射

292 Bragg angle 布 格角 | 293 Bragg diffraction 布 格衍射,布 格绕射 | 294 Bragg plane 布 格平面

ultrasonic Bragg diffraction：超声布喇格衍射

ultrasonic Bragg cell 超声喇格盒 | ultrasonic Bragg diffraction 超声布喇格衍射 | ultrasonic cleaning 超声清洗